Paper ThD4.7
Li, Yiming (National Chiao Tung University), Chen, Chien-Hung (Department of Electrical Engineering, National Cheng-Kung Univer)
Experimentally Effective Clean Process to C-V Characteristic Variation Reduction of HKMG MOS Devices
Scheduled for presentation during the Oral Session "Nanoelectronics: Circuits and Architecture IV" (ThD4), Thursday, August 8, 2013,
17:30−17:45, Diamond II
13th IEEE International Conference on Nanotechnology, August 5-8, 2013, Shangri-La Hotel, Beijing, China
This information is tentative and subject to change. Compiled on March 2, 2021
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