Paper WeA6.3
Li, Yiming (National Chiao Tung University), Chen, Yu-Yu (National Chiao Tung University, NTCU)
Statistical Device Simulation of Intrinsic Parameter Fluctuation in 16-Nm-Gate N and P-Type Bulk FinFETs
Scheduled for presentation during the Oral Session "Simulation and Modeling of Nanostructures and Nanodevices" (WeA6), Wednesday, August 7, 2013,
13:30−13:45, Diamond III
13th IEEE International Conference on Nanotechnology, August 5-8, 2013, Shangri-La Hotel, Beijing, China
This information is tentative and subject to change. Compiled on March 2, 2021
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